Boron surface phase on Si(111): Atomic structure and Si overgrowth studied by scanning tunneling microscopy and work function measurement

Thin Solid Films

Volumn 380, Issue 1-2, 2000, Pages 29-31

  Stimpel, T ^a   Hoster, H E ^a   Schulze, J ^a   Baumgartner H ^a   Eisele, I ^a  

^a BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CRYSTAL LATTICES; FILM GROWTH; IMAGE RECONSTRUCTION; MOLECULAR STRUCTURE; SEMICONDUCTING BORON; SEMICONDUCTING SILICON;

BORON SURFACE PHASES; SCANNING TUNNELING MICROSCOPY (STM);

SEMICONDUCTING FILMS;

EID: 0034513983     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01464-4     Document Type: Article

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