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Volumn 538-539, Issue , 2002, Pages 191-203
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Applications of microwave reflectance methods to the study of p-Si in fluoride solutions
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Author keywords
Electropolishing; Light modulated microwave reflectivity; Microwave; Porous silicon; Potential modulated microwave reflectivity; Silicon
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Indexed keywords
CAPACITANCE;
CARRIER CONCENTRATION;
CHARGE TRANSFER;
ELECTRIC SPACE CHARGE;
ELECTROLYTIC POLISHING;
ELECTROMAGNETIC WAVE REFLECTION;
FLUORINE COMPOUNDS;
LIGHT MODULATION;
MICROWAVES;
POROUS SILICON;
RATE CONSTANTS;
REDUCTION;
SEMICONDUCTOR JUNCTIONS;
SILICON;
SOLUTIONS;
SURFACE REACTIONS;
MICROWAVE REFLECTANCE;
ELECTROCHEMISTRY;
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EID: 0037073459
PISSN: 00220728
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0728(02)01141-5 Document Type: Article |
Times cited : (11)
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References (41)
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