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Thin Solid Films

Volumn 406, Issue 1-2, 2002, Pages 250-254

Studies on Ge/CeO2 thin film system using positron beam and Raman spectroscopy

(7) Venugopal Rao, G a Amarendra, G a Viswanathan, B a Kanakaraju, S b Balaji, S b Mohan, S b Sood, A K b

a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH (India)

b INDIAN INSTITUTE OF SCIENCE (India)

Author keywords

Amorphous materials; Defects; Germanium; Positron spectroscopy; Raman scattering

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CERIUM COMPOUNDS; CRYSTAL DEFECTS; FILM GROWTH; GERMANIUM; POSITRONS; RAMAN SCATTERING; SUBSTRATES;

POSITRON SPECTROSCOPY;

THIN FILMS;

EID: 0037051264 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(02)00056-1 Document Type: Article

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.