In situ Raman monitoring of ultrathin Ge films

Journal of Applied Physics

Volumn 84, Issue 10, 1998, Pages 5756-5760

  Kanakaraju, S ^a   Sood, A K ^a   Mohan, S ^a,b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b CSIR CENTRAL SCIENTIFIC INSTRUMENTS ORGANISATION   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008926952     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368866     Document Type: Article

References (27)

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