A low voltage time of flight electron emission microscope

Optik (Jena)

Volumn 113, Issue 11, 2002, Pages 505-509

  Khursheed, Anjam ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Electron emission microscopy; Time of flight spectroscopy

Indexed keywords

ABERRATIONS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; OPTICAL DESIGN; PHOTOEMISSION; SECONDARY EMISSION;

FLIGHT ELECTRON EMISSION MICROSCOPE; PHOTOELECTRON EMISSION MICROSCOPE; SECONDARY ELECTRON BEAM VOLTAGES; SECONDARY ELECTRON EMISSION MICROSCOPE; X RAY PHOTOEMISSION ELECTRON MICROSCOPE;

ELECTRON MICROSCOPY;

EID: 0036995789     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1078/0030-4026-00202     Document Type: Article

References (11)

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