Single-event transients in high-speed comparators

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 3082-3089

  Johnston, A H ^a   Miyahira, T F ^a   Edmonds, L D ^a   Irom, F ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Radiation effects; Single event transients (SETs); Voltage comparators

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; IONS; RADIATION EFFECTS; SEMICONDUCTOR JUNCTIONS; SWITCHING;

SINGLE EVENT TRANSIENTS (SET);

COMPARATOR CIRCUITS;

EID: 0036947662     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805397     Document Type: Conference Paper

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