Suppression of parasitic BJT action in single pocket thin film deep sub-micron SOI MOSFETs

Materials Research Society Symposium - Proceedings

Volumn 716, Issue , 2002, Pages 3-8

  Najeeb Ud Din, ^a   Aatish, K ^a   Dunga, Mohan V ^a   Ramgopal Rao, V ^a   Vasi, J ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; COMPUTER SIMULATION; LEAKAGE CURRENTS; SILICON ON INSULATOR TECHNOLOGY; THIN FILMS;

BIPOLAR JUNCTION TRANSISTOR; GATE INDUCED DRAIN LEAKAGE CURRENT TECHNIQUE; SINGLE POCKET THIN FILMS;

MOSFET DEVICES;

EID: 0036945638     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-716-b1.1     Document Type: Conference Paper

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