Performance limits of silicon MOSFET's

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 547-550

  Assad, Farzin ^a   Ren, Zhibin ^a   Datta, Supriyo ^a   Lundstrom, Mark ^a   Bendix, Peter ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TRANSPORT PROPERTIES; MONTE CARLO METHODS; PERFORMANCE; SEMICONDUCTING SILICON;

CHANNEL BACKSCATTERING COEFFICIENTS; CHANNEL INJECTION VELOCITY;

MOSFET DEVICES;

EID: 0033352176     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)