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Volumn 23, Issue 3-4, 1998, Pages 771-780

The silicon MOSFET from a transmission viewpoint

Author keywords

Landauer formula; MOSFET; Transmission formalism

Indexed keywords

ELECTRIC CONTACTS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRIC RESISTANCE; TRANSPORT PROPERTIES;

EID: 0031700495     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1997.0563     Document Type: Article
Times cited : (86)

References (19)
  • 1
    • 0002662487 scopus 로고
    • Transport as a consequence of incident flux
    • edited by G. Bergmann, Y. Bruynseraede, and B. Kramer Springer, Heidelberg
    • R. Landauer, Transport as a Consequence of Incident Flux, in Localization, Interaction, and Transport Phenomena in Impure Metals, edited by G. Bergmann, Y. Bruynseraede, and B. Kramer (Springer, Heidelberg, 1985).
    • (1985) Localization, Interaction, and Transport Phenomena in Impure Metals
    • Landauer, R.1
  • 8
    • 0023310827 scopus 로고
    • K. K. Ng and W. T. Lynch, IEEE Trans. Electron Dev. 33, 965 (1986); 34 503 (1987).
    • (1987) IEEE Trans. Electron Dev. , vol.34 , pp. 503
  • 9
    • 0041773854 scopus 로고    scopus 로고
    • private communication
    • W. T. Lynch, private communication, 1997.
    • (1997)
    • Lynch, W.T.1
  • 10
    • 0003605397 scopus 로고
    • edited by G. Grinstein and G. Mazenko World Scientific Press
    • Y. Imry, in Directions in Condensed Matter Physics, edited by G. Grinstein and G. Mazenko (World Scientific Press, 1986).
    • (1986) Directions in Condensed Matter Physics
    • Imry, Y.1
  • 17
    • 84886447983 scopus 로고    scopus 로고
    • Low leakage, ultra-thin gate oxides for extremely high performance sub-100 nm nMOSFETs
    • Washington, D.C., 8-10 December
    • G. Timp et al. 'Low Leakage, Ultra-thin Gate Oxides for Extremely High Performance sub-100 nm nMOSFETs', Conf. Digest, International Electron Devices Meeting, Washington, D.C., 8-10 December, 1997.
    • (1997) Conf. Digest, International Electron Devices Meeting
    • Timp, G.1
  • 18
    • 0003409205 scopus 로고
    • See Chapter 8, Cambridge University Press, Cambridge, UK, see Chapter 2
    • See Chapter 8, S. Datta, Electronic Transport in Mesoscopic Systems, Cambridge University Press, Cambridge, UK, 1995, see Chapter 2.
    • (1995) Electronic Transport in Mesoscopic Systems
    • Datta, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.