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Volumn 715, Issue , 2002, Pages 583-588
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Influence of ZnO/p+a-Si:H microcrystallization and antireflection coatings on pin a-Si:H solar cells performance
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTIREFLECTION COATINGS;
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
COMPOSITION;
COMPOSITION EFFECTS;
CRYSTALLIZATION;
CURRENT VOLTAGE CHARACTERISTICS;
FILMS;
OPTICAL VARIABLES MEASUREMENT;
SURFACE ROUGHNESS;
X RAY ANALYSIS;
ZINC COMPOUNDS;
GRAZING INCIDENCE X RAY ANALYZES;
LIGHT FLUX;
MICROCRYSTALLIZATION;
OPTOELECTRONIC PROPERTIES;
SILICON SOLAR CELLS;
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EID: 0036929361
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-715-a6.7 Document Type: Conference Paper |
Times cited : (3)
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References (10)
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