First test results of system level fault tolerant design validation through laser fault injection

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 1997, Pages 544-548

  Moreno, Wilfrido A ^a   Falquez, Fernando J ^a   Samson Jr , John R ^a   Smith, Thomas ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEM RECOVERY; ERROR CORRECTION; ERROR DETECTION; LASER APPLICATIONS; LASER PULSES; PROGRAM PROCESSORS; SHIFT REGISTERS; VLSI CIRCUITS;

LASER FAULT INJECTION (LFI);

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0031338474     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)