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Volumn , Issue , 2002, Pages 617-620
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Experimental determination of band offset energies between Zr silicate alloy dielectrics and crystalline Si substrates by XAS, XPS and AES and ab initio theory: A new approach to the compositional dependence of direct tunneling currents
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
BAND STRUCTURE;
BINDING ENERGY;
CHEMICAL BONDS;
COMPOSITION;
CRYSTALLINE MATERIALS;
DIELECTRIC DEVICES;
ELECTRONIC STRUCTURE;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SILICATES;
SUBSTRATES;
X RAY PHOTOELECTRON SPECTROSCOPY;
BAND OFFSET ENERGIES;
ZIRCONIUM ALLOYS;
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EID: 0036923459
PISSN: 01631918
EISSN: None
Source Type: Journal
DOI: 10.1109/IEDM.2002.1175915 Document Type: Article |
Times cited : (15)
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References (11)
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