메뉴 건너뛰기




Volumn , Issue , 2002, Pages 617-620

Experimental determination of band offset energies between Zr silicate alloy dielectrics and crystalline Si substrates by XAS, XPS and AES and ab initio theory: A new approach to the compositional dependence of direct tunneling currents

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BAND STRUCTURE; BINDING ENERGY; CHEMICAL BONDS; COMPOSITION; CRYSTALLINE MATERIALS; DIELECTRIC DEVICES; ELECTRONIC STRUCTURE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICATES; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036923459     PISSN: 01631918     EISSN: None     Source Type: Journal    
DOI: 10.1109/IEDM.2002.1175915     Document Type: Article
Times cited : (15)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.