Transport path in hydrogenated microcrystalline silicon

Materials Research Society Symposium - Proceedings

Volumn 715, Issue , 2002, Pages 363-370

  Wyrsch, N ^a   Droz, C ^a   Feitknecht, L ^a   Spitznagel, J ^a   Shah, A ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY MEASUREMENT; HYDROGENATION; OXIDATION; PERCOLATION (SOLID STATE); PHASE TRANSITIONS; RAMAN SPECTROSCOPY; TRANSPORT PROPERTIES; VOLUME FRACTION;

DARK CONDUCTIVITY; MICROCRYSTALLINE SILICON; TRANSPORT PATH;

SILICON;

EID: 0036918546     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-715-a25.3     Document Type: Conference Paper

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