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Volumn , Issue , 2002, Pages 87-93

Conflict driven techniques for improving deterministic test pattern generation

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; STRUCTURAL DOMINATOR;

EID: 0036911404     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/774572.774585     Document Type: Conference Paper
Times cited : (23)

References (22)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.