Robust search algorithms for test pattern generation

Digest of Papers - 27th Annual International Symposium on Fault-Tolerant Computing, FTCS 1997

Volumn , Issue , 1997, Pages 152-161

  Silva, João P Marques ^a   Sakallah, Karem A ^b  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b University of Michigan   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANCE; HEURISTIC ALGORITHMS; LEARNING ALGORITHMS;

APPLICATION SPECIFIC; EFFECTIVE ALGORITHMS; EMPIRICAL PERFORMANCE; HEURISTIC KNOWLEDGE; PROPOSITIONAL SATISFIABILITY; ROBUST SEARCH ALGORITHMS; SEARCH ALGORITHMS; TEST PATTERN GENERATIONS;

AUTOMATIC TEST PATTERN GENERATION;

EID: 53149101426     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FTCS.1997.614088     Document Type: Conference Paper

References (19)

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