Recursive Learning: An attractive alternative to the decision tree for test generation in digital ci

Proceedings - International Test Conference

Volumn 1992-January, Issue , 1992, Pages 816-825

  Kunz, W ^a   Pradhan, D K ^b  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

Circuit faults; Circuit testing; Combinational circuits; Decision trees; Logic testing; Sequential analysis; Sequential circuits; Signal generators; Space exploration; System testing

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER CIRCUITS; DECISION TREES; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUITS; RECONFIGURABLE HARDWARE; SEQUENTIAL CIRCUITS; SIGNAL GENERATORS; SPACE RESEARCH; VECTOR SPACES;

CIRCUIT FAULTS; CIRCUIT TESTING; LOGIC TESTING; SEQUENTIAL ANALYSIS; SPACE EXPLORATIONS; SYSTEM TESTING;

LOGIC CIRCUITS;

EID: 84961249468     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1992.527905     Document Type: Conference Paper

References (0)