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Volumn 15, Issue 8, 2000, Pages 1649-1652
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Micropipes in silicon carbide crystals: Do all screw dislocations have open cores?
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ETCHING;
ION BEAMS;
LATTICE CONSTANTS;
RELAXATION PROCESSES;
SCANNING ELECTRON MICROSCOPY;
SILICON WAFERS;
PHYSICAL VAPOR TRANSPORT (PVT);
SILICON CARBIDE;
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EID: 0034256173
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2000.0236 Document Type: Article |
Times cited : (12)
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References (17)
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