-
1
-
-
0026867876
-
High-transconductance n-type Si/SiGe modulation doped field effect transistors
-
Ismail K., Meyerson B.S., Rishton S., Chu J., Nelson S., Nocera J. High-transconductance n-type Si/SiGe modulation doped field effect transistors. IEEE Electron Dev. Lett. 13(5):1992;229-231.
-
(1992)
IEEE Electron Dev. Lett.
, vol.13
, Issue.5
, pp. 229-231
-
-
Ismail, K.1
Meyerson, B.S.2
Rishton, S.3
Chu, J.4
Nelson, S.5
Nocera, J.6
-
2
-
-
0011648282
-
Design and fabrication of SiGe n-type MODFET's
-
Gluck M., Hackbarth T., Birk M., Haas A., Kohn E., König U. Design and fabrication of SiGe n-type MODFET's. Physica E. 2(1):1998;763-767.
-
(1998)
Physica E
, vol.2
, Issue.1
, pp. 763-767
-
-
Gluck, M.1
Hackbarth, T.2
Birk, M.3
Haas, A.4
Kohn, E.5
König, U.6
-
3
-
-
0032179714
-
Si:SiGe MODFET current mirror
-
Fobelets K., Jeamsaksiri W., Hampson J., Toumazou C. Si:SiGe MODFET current mirror. Electron. Lett. 34(22):1998;2076-2077.
-
(1998)
Electron. Lett.
, vol.34
, Issue.22
, pp. 2076-2077
-
-
Fobelets, K.1
Jeamsaksiri, W.2
Hampson, J.3
Toumazou, C.4
-
4
-
-
0032485172
-
Transimpedance amplifiers based on Si:SiGe MODFETs
-
Saxarra M., Gluck M., Albers J.N., Benhammer D., Langmann U., Konig U. Transimpedance amplifiers based on Si:SiGe MODFETs. Electron. Lett. 34(5):1998;499-500.
-
(1998)
Electron. Lett.
, vol.34
, Issue.5
, pp. 499-500
-
-
Saxarra, M.1
Gluck, M.2
Albers, J.N.3
Benhammer, D.4
Langmann, U.5
Konig, U.6
-
5
-
-
0035395813
-
Electron mobility enhancement in strained Si n-MOSFETs fabricated on SiGe-on-insulator (SGOI) substrates
-
Cheng Z.-Y., Currie M.T., Leitz C.W., Taraschi G., Fitzgerald E.A., Hoyt J.L.et al. Electron mobility enhancement in strained Si n-MOSFETs fabricated on SiGe-on-insulator (SGOI) substrates. IEEE Electron Dev. Lett. 22(7):2001;321-323.
-
(2001)
IEEE Electron Dev. Lett.
, vol.22
, Issue.7
, pp. 321-323
-
-
Cheng, Z.-Y.1
Currie, M.T.2
Leitz, C.W.3
Taraschi, G.4
Fitzgerald, E.A.5
Hoyt, J.L.6
-
6
-
-
0011651852
-
Experimental and theoretical study of backgating in Si/SiGe modulation-doped field-effect transistors
-
Granada, Spain, 15-16 February
-
Velázquez JE, Jeamsaksiri W, Yeoh JC, Thornton TJ, Fobelets K. Experimental and theoretical study of backgating in Si/SiGe modulation-doped field-effect transistors. In: IEEE CDE2001 Conference, Granada, Spain, 15-16 February, p. 81-4.
-
IEEE CDE2001 Conference
, pp. 81-84
-
-
Velázquez, J.E.1
Jeamsaksiri, W.2
Yeoh, J.C.3
Thornton, T.J.4
Fobelets, K.5
-
7
-
-
0034445246
-
Design of nearly body-effect free Si/SiGe MODFETs
-
IEEE Piscetoway, NY, USA
-
Velázquez JE, Jeamsaksiri W, Yeoh JC, Fobelets K. Design of nearly body-effect free Si/SiGe MODFETs. In: 8th IEEE Int. Symp. High Performance Electron Devices for Microwave and Optoelectronics Applications, IEEE Piscetoway, NY, USA, 2000;32-7.
-
(2000)
8th IEEE Int. Symp. High Performance Electron Devices for Microwave and Optoelectronics Applications
, pp. 32-37
-
-
Velázquez, J.E.1
Jeamsaksiri, W.2
Yeoh, J.C.3
Fobelets, K.4
-
8
-
-
0011523399
-
-
Avant TCAD Business Unit, Fremont California
-
Medici 1999.2 User's manual, Avant TCAD Business Unit, Fremont California.
-
Medici 1999.2 User's manual
-
-
-
10
-
-
0342362281
-
n- and p-type SiGe HFETs and circuits
-
Konig U., Zeuner M., Hock G., Hackbarth T., Gluck M., Ostermann T.et al. n- and p-type SiGe HFETs and circuits. Solid State Electron. 43(8):1999;1383-1388.
-
(1999)
Solid State Electron.
, vol.43
, Issue.8
, pp. 1383-1388
-
-
Konig, U.1
Zeuner, M.2
Hock, G.3
Hackbarth, T.4
Gluck, M.5
Ostermann, T.6
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