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Volumn 46, Issue 12, 2002, Pages 2241-2245

Optimised n-channel Si/SiGe HFETs design for VTH shift immunity

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; HETEROJUNCTIONS; OPTIMIZATION; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING; THRESHOLD VOLTAGE;

EID: 0036890565     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00228-9     Document Type: Article
Times cited : (4)

References (10)
  • 5
    • 0035395813 scopus 로고    scopus 로고
    • Electron mobility enhancement in strained Si n-MOSFETs fabricated on SiGe-on-insulator (SGOI) substrates
    • Cheng Z.-Y., Currie M.T., Leitz C.W., Taraschi G., Fitzgerald E.A., Hoyt J.L.et al. Electron mobility enhancement in strained Si n-MOSFETs fabricated on SiGe-on-insulator (SGOI) substrates. IEEE Electron Dev. Lett. 22(7):2001;321-323.
    • (2001) IEEE Electron Dev. Lett. , vol.22 , Issue.7 , pp. 321-323
    • Cheng, Z.-Y.1    Currie, M.T.2    Leitz, C.W.3    Taraschi, G.4    Fitzgerald, E.A.5    Hoyt, J.L.6
  • 6
    • 0011651852 scopus 로고    scopus 로고
    • Experimental and theoretical study of backgating in Si/SiGe modulation-doped field-effect transistors
    • Granada, Spain, 15-16 February
    • Velázquez JE, Jeamsaksiri W, Yeoh JC, Thornton TJ, Fobelets K. Experimental and theoretical study of backgating in Si/SiGe modulation-doped field-effect transistors. In: IEEE CDE2001 Conference, Granada, Spain, 15-16 February, p. 81-4.
    • IEEE CDE2001 Conference , pp. 81-84
    • Velázquez, J.E.1    Jeamsaksiri, W.2    Yeoh, J.C.3    Thornton, T.J.4    Fobelets, K.5
  • 8
    • 0011523399 scopus 로고    scopus 로고
    • Avant TCAD Business Unit, Fremont California
    • Medici 1999.2 User's manual, Avant TCAD Business Unit, Fremont California.
    • Medici 1999.2 User's manual
  • 9
    • 0035483088 scopus 로고    scopus 로고
    • SiGe hetero-FET potential for micro-power applications
    • Pappavassiliou C., Fobelets K., Toumazou C. SiGe hetero-FET potential for micro-power applications. IEICE Trans. Electron. E84C(10):2000;1414-1422.
    • (2000) IEICE Trans. Electron. , vol.E84C , Issue.10 , pp. 1414-1422
    • Pappavassiliou, C.1    Fobelets, K.2    Toumazou, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.