Reflection high-energy electron diffraction observation of the dynamics of semiconductor quantum dot formation and decay

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 6, 2002, Pages 2210-2213

  Finnie, P ^a   Riel, B J ^a,b   Wasilewski, Z R ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b UNIVERSITY OF OTTAWA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DISSOLUTION; MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; NUCLEATION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;

GROWTH INTERRUPTIONS; OPTICAL PYROMETRY;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0036883073     PISSN: 0734211X     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1515912     Document Type: Article

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