Phase coexistence and morphology at the Si(1 1 0) surface phase transition

Surface Science

Volumn 519, Issue 1-2, 2002, Pages

  Swiech, Waclaw ^a   Schwarz Selinger, Thomas ^a   Cahill, David G ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Low energy electron microscopy (LEEM); Silicon; Surface structure, morphology, roughness, and topography; Surface thermodynamics (including phase transitions)

Indexed keywords

MICROSTRUCTURE; NUCLEATION; PHASE TRANSITIONS; SURFACE ROUGHNESS;

LASER TEXTURING;

SURFACE STRUCTURE;

EID: 0036838897     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02216-1     Document Type: Article

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