High-temperature scanning tunneling microscopy study of the `16×2'↔(1×1) phase transition on an Si(110) surface

Surface Science

Volumn 466, Issue 1-3, 2000, Pages 183-188

  Yamamoto, Youiti ^a   Sueyoshi, Takashi ^a   Sato, Tomoshige ^a   Iwatsuki, Masashi ^a  

^a JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS; THERMODYNAMICS;

ISING MODEL;

SILICON;

EID: 0034318697     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00773-1     Document Type: Article

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