메뉴 건너뛰기




Volumn 33, Issue 10-11, 2002, Pages 850-861

Characterization of the interface in rubber/silica composite materials

Author keywords

Silica rubber interface; XAES; XPS

Indexed keywords

ADHESION; AUGER ELECTRON SPECTROSCOPY; BUTADIENE; COMPOSITE MATERIALS; ELASTOMERS; FILLERS; RUBBER; SILICA; STYRENE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036806371     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1463     Document Type: Article
Times cited : (23)

References (29)
  • 7
    • 0000503141 scopus 로고
    • Briggs D, Seah MP (eds). John Wiley: Chichester; Chapter 5.
    • Seah MP. In Practical Surface Analysis, Briggs D, Seah MP (eds). John Wiley: Chichester, 1990; Chapter 5. 201-255.
    • (1990) Practical Surface Analysis , pp. 201-255
    • Seah, M.P.1
  • 14
    • 0000589349 scopus 로고
    • Briggs D, Seah MP (eds). John Wiley: Chichester; Appendix 4
    • Wagner CD. In Practical Surface Analysis, Briggs D, Seah MP (eds). John Wiley: Chichester, 1990. Appendix 4, 587-594.
    • (1990) Practical Surface Analysis , pp. 587-594
    • Wagner, C.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.