Curve-fitting in XPS using extrinsic and intrinsic background structure

Journal of Electron Spectroscopy and Related Phenomena

Volumn 106, Issue 1, 2000, Pages 65-80

  Castle, J E ^a   Chapman Kpodo, H ^a   Proctor, A ^b   Salvi, A M ^c  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Quantegy Inc   (United States)

^c UNIVERSITY OF BASILICATA   (Italy)

Author keywords

Angle resolved XPS (ARXPS); Curve fitting; Extrinsic and intrinsic background; Thin films; XPS

Indexed keywords

EID: 0002660446     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(99)00089-4     Document Type: Article

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