Percolation study of defect tolerance in missing-crossbar networks

Solid State Communications

Volumn 124, Issue 5-6, 2002, Pages 167-170

  Zwolak, Michael P ^a   Zallen, Richard ^a   Di Ventra, Massimiliano ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

A. Nanoelectronics; A. Nanostructures; D. Percolation

Indexed keywords

COMPUTER ARCHITECTURE; CROSSBAR EQUIPMENT; NANOSTRUCTURED MATERIALS; PERCOLATION (SOLID STATE);

CROSSBAR NETWORKS; DEFECT TOLERANCE;

NANOTECHNOLOGY;

EID: 0036802066     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(02)00541-0     Document Type: Article

References (21)

1. Metzger R.M., et al. J. Am. Chem. Soc. 119:1997;10455.
2. Zhou C., Deshpande M.R., Reed M.A., Jones L., Tour J.M. Appl. Phys. Lett. 71:1997;611.
3. Reed M.A., Zhou C., Muller C.J., Burgin T.P., Tour J.M. Science. 278:1997;252.
4. Datta S., Tian W., Hong S., Reifenberger R., Henderson J.I., Kubiak C.P. Phys. Rev. Lett. 79:1997;2530.
5. Gimzewski J.K., Joachim C. Science. 283:1999;1683.
6. Chen J., Reed M.A., Rawlett A.M., Tour J.M. Science. 286:1999;1550.
7. Donhauser Z.J., et al. Science. 292:2001;2303.
8. Reed M.A., Chen J., Rawlett A.M., Price D.W., Tour J.M. Appl. Phys. Lett. 78:2001;3735.
9. Datta S., Tian W., Hong S., Reifenberger R., Henderson J.I., Kubiak C.P. Phys. Rev. Lett. 79:1997;2530.
10. Samanta M.P., Tian W., Datta S., Henderson J.I., Kubiak C.P. Phys. Rev. B. 53:1996;R7626.
11. Di Ventra M., Pantelides S.T., Lang N.D. Phys. Rev. Lett. 84:2000;979.
12. Di Ventra M., Pantelides S.T., Lang N.D. Appl. Phys. Lett. 76:2000;3448.
13. Di Ventra M., Kim S.-G., Pantelides S.T., Lang N.D. Phys. Rev. Lett. 86:2001;288.
14. Xue Y., Datta S., Ratner M.A. J. Chem. Phys. 115:2001;4292.
15. Lang N.D., Avouris P. Phys. Rev. B. 64:2001;125323.
16. Zallen R. The Physics of Amorphous Solids. 1983;Wiley, New York.
17. Stauffer D., Aharony A. Introduction to Percolation Theory. 2nd ed. 1994;Taylor & Francis, London.
18. Heath J.R., Kuekes P.J., Snider G.S., Williams R.S. Science. 280:1998;1716.
19. Rueckes T., Kim K., Joselevich E., Tseng G.Y., Cheung C.-L., Lieber C.M. Science. 289:2000;94.
20. Huang Y., Duan X., Wei Q., Lieber C.M. Science. 291:2001;630.
21. Hsu H.P., Huang M.C. Phys. Rev. E. 60:1999;6361.