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Volumn 36, Issue 6, 2001, Pages 641-651

Capabilities of static TOF-SIMS in the differentiation of first-row transition metal oxides

Author keywords

Chromium oxides; Cluster ions; Inorganic speciation; Static time of flight secondary ion mass spectrometry; Transition metal oxides

Indexed keywords

MASS SPECTROMETRY; OXIDES; STOICHIOMETRY; THERMODYNAMICS;

EID: 0034942237     PISSN: 10765174     EISSN: None     Source Type: Journal    
DOI: 10.1002/jms.165     Document Type: Article
Times cited : (34)

References (38)
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    • (1999) , pp. 786
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    • In Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, 5-11 September 1999. Elsevier: Amsterdam
    • (2000) , pp. 875
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  • 19
    • 84882757806 scopus 로고    scopus 로고
    • In Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry, Orlando, FL, 7-12 September 1997. Wiley: New York
    • (1998) , pp. 943
    • Chartogne, A.1    Saldi, F.2
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    • PhD Thesis, University of Antwerp
    • (2000)
    • Cuynen, E.1
  • 28


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.