Explaining strain

IEEE Circuits and Devices Magazine

Volumn 18, Issue 5, 2002, Pages 36-39

  Keyes, Robert W ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036758703     PISSN: 87553996     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCD.2002.1035350     Document Type: Article

References (17)

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