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Volumn 68, Issue 14, 1996, Pages 1975-1977

Thermal stability of undoped strained Si channel SiGe heterostructures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000826849     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115644     Document Type: Article
Times cited : (31)

References (13)
  • 10
    • 22244454192 scopus 로고    scopus 로고
    • B. L. Sharma, Defect Diffusion Forum 70, 1 (1990).
    • B. L. Sharma, Defect Diffusion Forum 70, 1 (1990).
  • 11
    • 22244452757 scopus 로고    scopus 로고
    • W. Frank, Defect Diffusion Forum 75, 121 (1991)
    • W. Frank, Defect Diffusion Forum 75, 121 (1991)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.