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Volumn 249, Issue 3, 2002, Pages 492-498
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The quest for fast phase change materials
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Author keywords
Atomic force microscopy; Crystallization; Kinetics; Phase change recording; Transformation; X ray reflection
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPOSITION;
CRYSTAL GROWTH;
CRYSTALLIZATION;
NUCLEATION;
PHASE TRANSITIONS;
REACTION KINETICS;
RECRYSTALLIZATION (METALLURGY);
X-RAY REFLECTION;
MAGNETIC RECORDING;
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EID: 0036753492
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(02)00468-7 Document Type: Article |
Times cited : (18)
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References (15)
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