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Journal of Applied Physics

Volumn 92, Issue 5, 2002, Pages 2729-2733

Uniformity tests of individual segments of interband cascade diode laser Nanostacks®

(5) Malyarchuk, V a Tomm, J W a Lienau, Ch a Behringer, M b Luft, J b

a MAX BORN INSTITUT (Germany)

b OSRAM OPTO SEMICONDUCTORS GMBH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH SPATIAL RESOLUTION; INTERBAND CASCADES; LASER EMISSION; NEAR FIELD OPTICAL MICROSCOPY; NON DESTRUCTIVE; OPTICALLY ACTIVE; OPTOELECTRONIC PROPERTIES; POTENTIAL GRADIENTS; TRAP CONCENTRATION; WAVEGUIDE SEGMENTS;

OPTOELECTRONIC DEVICES; SEMICONDUCTOR QUANTUM WELLS; SEPARATION; TUNNEL JUNCTIONS;

QUANTUM WELL LASERS;

EID: 0036733853 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1497460 Document Type: Article

Times cited : (6)

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