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Volumn 49, Issue 8, 2002, Pages 1187-1197
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Modeling the thermal response of semiconductor devices through equivalent electrical networks
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Author keywords
Circuit modeling; Electrothermal analysis; Thermal instability
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Indexed keywords
BIPOLAR TRANSISTORS;
MOSFET DEVICES;
OSCILLATORS (ELECTRONIC);
TERMINALS (ELECTRIC);
THERMODYNAMIC STABILITY;
THERMAL IMPEDANCE;
ELECTRIC NETWORK ANALYSIS;
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EID: 0036688673
PISSN: 10577122
EISSN: None
Source Type: Journal
DOI: 10.1109/TCSI.2002.801279 Document Type: Article |
Times cited : (31)
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References (20)
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