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Volumn 49, Issue 8, 2002, Pages 1187-1197

Modeling the thermal response of semiconductor devices through equivalent electrical networks

Author keywords

Circuit modeling; Electrothermal analysis; Thermal instability

Indexed keywords

BIPOLAR TRANSISTORS; MOSFET DEVICES; OSCILLATORS (ELECTRONIC); TERMINALS (ELECTRIC); THERMODYNAMIC STABILITY;

EID: 0036688673     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2002.801279     Document Type: Article
Times cited : (31)

References (20)
  • 9
    • 0030244881 scopus 로고    scopus 로고
    • A rational formulation of thermal circuit models for electrothermal simulation - Part II: Model reduction techniques
    • Sept.
    • (1996) IEEE Trans. Circuits Syst. I , vol.43 , pp. 733-744
  • 14
    • 0001775647 scopus 로고
    • Internal thermal feedback in four-poles especially in transistors
    • Aug.
    • (1964) Proc. IEEE , vol.52 , pp. 924-930
    • Mueller, O.1
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.