Electro-thermal resonance in MOSFET devices

Electronics Letters

Volumn 37, Issue 1, 2001, Pages 57-58

  Codecasa, L ^a   D'Amore, D ^a   Maffezzoni, P ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; RESONANCE; WAVEFORM ANALYSIS;

DIGITAL OSCILLOSCOPES; ELECTRO-THERMAL RESONANCES;

MOSFET DEVICES;

EID: 0035127335     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20010045     Document Type: Article

References (3)

1. D'AMORE, D., and MAFFEZZONI, P.: 'Exploiting electro-thermal resonance in high voltage power bipolar devices', Electron. Lett., 1999, 35, (7), pp. 600-602
2. D'AMORE, D., and MAFFEZZONI, P.: 'Analysis of fast electro-thermal dynamics in power BJT', IEEE Trans. Electron Devices, 2000, 47, (9), pp. 1758-1763
3. LE NEEL, O., and HAOND, M.: 'Electrical transient study of negative resistance in SOI MOS transistors', Electron. Lett., 1990, 26, (1), pp. 73-74