Spectroscopic ellipsometry investigation of Ga1-xInxN/GaN single and double quantum well structures

Solid State Communications

Volumn 123, Issue 9, 2002, Pages 395-398

  Lee, Myoung Hee ^a   Kim, Kwang Joo ^a   Oh, Eunsoon ^b  

^a Konkuk University   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

A. Quantum wells; A. Thin films; D. Optical properties

Indexed keywords

CHARGE CARRIERS; ELLIPSOMETRY; ENERGY GAP; MULTILAYERS; QUANTUM THEORY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

SPECTROSOPIC ELLIPSOMETRY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0036670995     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(02)00357-5     Document Type: Article

References (10)