Surface forces in colloidal processing with nano-particles

Materials and Manufacturing Processes

Volumn 17, Issue 4, 2002, Pages 543-551

  Lee, Seung Woo ^a   Cho, Jeong Min ^a   Sigmund, Wolfgang M ^a  

^a University of Florida   (United States)

Author keywords

Atomic force microscope; Carbon nanotube; Colloidal processing; Colloidal stability; Nano particle; Surface force measurement; Surface forces; Van der Waals interaction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; INTERFACIAL ENERGY; SURFACE MEASUREMENT; VAN DER WAALS FORCES;

COLLOIDAL PROCESSING; COLLOIDAL STABILITY; SURFACE FORCES;

NANOSTRUCTURED MATERIALS;

EID: 0036659068     PISSN: 10426914     EISSN: None     Source Type: Journal    
DOI: 10.1081/AMP-120014239     Document Type: Article

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