Electronic tunneling through self-assembled monolayers of phenylene oligomers on Au(111)

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 7 B, 2002, Pages 4998-5002

  Wakamatsu, Satoshi ^a   Akiba, Uichi ^a   Fujihira, Masamichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Bilayer junction; Conducting atomic force microscopy; Decay constant; Electronic tunneling; Phenylene oligomer; Self assembled monolayer

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; ELECTRIC POTENTIAL; ELECTRON MOBILITY; ELECTRON TUNNELING; ELECTRONIC STRUCTURE; GOLD; HOLE MOBILITY; MOLECULES; OLIGOMERS; THIN FILMS;

BILAYER JUNCTIONS; ELECTRON TRANSFER;

SELF ASSEMBLY;

EID: 0036658114     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.4998     Document Type: Conference Paper

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