Nanoscale modification of the hydrogen-terminated diamond surface using atomic force microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 7 B, 2002, Pages 4983-4986

  Sugata, Kenta ^a,b   Tachiki, Minoru ^a,b   Fukuda, Tohru ^a,b   Seo, Hokuto ^a,b   Kawarada, Hiroshi ^a,b  

^a WASEDA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

AFM; Anodic oxidation; Diamond; Insulation; SPM

Indexed keywords

ANODES; ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; CATHODES; ELECTRIC FIELD EFFECTS; ELECTRIC INSULATION; ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; ELECTROLYTES; EPITAXIAL GROWTH; HYDROGEN; NANOTECHNOLOGY; SEMICONDUCTING DIAMONDS;

HOMOEPITAXIAL SURFACES;

SURFACE TREATMENT;

EID: 0036657139     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.4983     Document Type: Conference Paper

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