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Volumn 46, Issue 7, 2002, Pages 1045-1050

Impact of technological parameters on non-stationary transport in realistic 50 nm MOSFET technology

Author keywords

MOSFET technology; Non stationary effects; Numerical simulation

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRON TRANSPORT PROPERTIES; OPTIMIZATION;

EID: 0036642915     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00040-0     Document Type: Conference Paper
Times cited : (7)

References (16)
  • 3
    • 35949009958 scopus 로고
    • Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects
    • (1988) Phys Rev B , vol.38 , Issue.14 , pp. 9721
    • Fischetti, M.1    Laux, S.2
  • 4
    • 35949025517 scopus 로고
    • The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials
    • (1983) Rev Mod Phys , vol.55 , Issue.3
    • Jacoboni, C.1    Reggiani, L.2
  • 6
    • 36149018649 scopus 로고
    • Diffusion of hot and cold electrons in semiconductor barriers
    • (1962) Phys Rev , vol.126 , Issue.6 , pp. 2002
    • Stratton, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.