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Volumn 41, Issue 6 A, 2002, Pages 3955-3960
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Calculation of the precursor flux from optical emission spectroscopy data in plasma enhanced chemical vapour deposition of silane and its correlation with the deposition rate
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Author keywords
Amorphous silicon; Microcrystalline silicon; Optical emission spectroscopy; Silane argon plasma
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Indexed keywords
AMORPHOUS SILICON;
MIXTURES;
NUMERICAL METHODS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
REACTION KINETICS;
SPECTROSCOPY;
DEPOSITION RATE;
MICROCRYSTALLINE SILICON;
OPTICAL EMISSION SPECTROSCOPY;
SILANES;
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EID: 0036614874
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.41.3955 Document Type: Article |
Times cited : (6)
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References (36)
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