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Volumn 41, Issue 6 A, 2002, Pages 3955-3960

Calculation of the precursor flux from optical emission spectroscopy data in plasma enhanced chemical vapour deposition of silane and its correlation with the deposition rate

Author keywords

Amorphous silicon; Microcrystalline silicon; Optical emission spectroscopy; Silane argon plasma

Indexed keywords

AMORPHOUS SILICON; MIXTURES; NUMERICAL METHODS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REACTION KINETICS; SPECTROSCOPY;

EID: 0036614874     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.3955     Document Type: Article
Times cited : (6)

References (36)
  • 22
    • 0010173769 scopus 로고
    • ed. Y. Gerasimov (Mir, Moscow); Chap. 1
    • (1985) Physical Chemistry , vol.2 , pp. 51


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.