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Volumn 193, Issue 1-4, 2002, Pages 294-298
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Molecular dynamics simulation of ion-beam-amorphization of Si, Ge and GaAs
a a a |
Author keywords
Amorphization; Defects; Irradiation; Semiconductors
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Indexed keywords
CHEMICAL BONDS;
COMPUTER SIMULATION;
CRYSTALLIZATION;
DEFECTS;
GERMANIUM;
ION BEAMS;
IRRADIATION;
MOLECULAR DYNAMICS;
SEMICONDUCTING GALLIUM ARSENIDE;
SILICON;
ION IRRADIATION;
AMORPHIZATION;
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EID: 0036609668
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)00794-2 Document Type: Conference Paper |
Times cited : (25)
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References (35)
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