Low temperature formation of Si(1 1 1)-(2n + 1) × (2n + 1) surface reconstructions

Surface Science

Volumn 511, Issue 1-3, 2002, Pages 312-318

  Fonin, M ^a   Choi, J M ^a   May, U ^a   Hauch, J O ^a   Rudiger U ^a   Guntherodt G ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Scanning tunneling microscopy; Silicon; Silver; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography

Indexed keywords

ANNEALING; CHEMICAL RELAXATION; DEPOSITION; DESORPTION; LOW TEMPERATURE EFFECTS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SILVER; STACKING FAULTS;

SURFACE RECONSTRUCTION;

SURFACE ROUGHNESS;

EID: 0036608429     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01514-5     Document Type: Article

References (37)