SCOPUS 정보 검색 플랫폼

Volumn 110, Issue 1281, 2002, Pages 386-390

Characterization of zinc oxide micropatterns deposited on self-assembled monolayer template

(4) Noriko, Saito a Hajime, Haneda a Di, L I a Kunihito, Koumoto a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Catalytic growth; Electroless deposition; Patterning; Self assembled monolayer; TEM; Template; Zinc oxide

Indexed keywords

CATALYSIS; CHARACTERIZATION; ELECTROLESS PLATING; MONOLAYERS; PARTICLE SIZE ANALYSIS; SELF ASSEMBLY; SINGLE CRYSTALS; SOLUTIONS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

PATTERNING;

ZINC OXIDE;

EID: 0036565634 PISSN: 09145400 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (9)

References (20)

1
- 0006016379
- Ed. by Shionoya, S. and Yen, W. M., CRC Press, Boca Raton Chap. 8.
- (1998) Phosphor Handbook
- Morimoto, K.¹

2
- 0035126240
- (2001) Adv. Mater. , vol.13 , pp. 113-116
- Huang, M.H.¹ Wu, Y.² Feick, H.³ Tran, N.⁴ Weber, E.⁵ Yang, P.⁶

3
- 0035827304
- (2001) Science , vol.292 , pp. 1897-1899
- Huang, M.H.¹ Mao, S.² Feick, H.³ Yan, H.⁴ Wu, Y.⁵ Kind, H.⁶ Weber, E.⁷ Russo, R.⁸ Yang, P.⁹

4
- 0035342048
- (2001) Thin Solid Films , vol.386 , pp. 117-120
- Lee, G.H.¹ Yamamoto, Y.² Kourogi, M.³ Ohtsu, M.⁴

5
- 0000342442
- (1999) Chem. Mater. , vol.11 , pp. 2305-2309
- Koumoto, K.¹ Seo, S.² Sugiyama, T.³ Seo, W.S.⁴ Dressick, W.J.⁵

6
- 0031273229
- (1997) J. Am. Ceram. Soc. , vol.80 , pp. 2821-2827
- Clem, P.G.¹ Jeon, N.L.² Nuzzo, R.G.³ Payne, D.A.⁴

7
- 0000259242
- (1996) Appl. Phys. Lett. , vol.69 , pp. 860-862
- Collins, R.J.¹ Shin, H.² DeGuire, M.R.³ Heuer, A.H.⁴ Sukenik, C.N.⁵

8
- 0028299525
- (1994) Science , vol.264 , pp. 48-55
- Bunker, B.C.¹ Rieke, P.C.² Tarasevich, B.J.³ Campbell, A.A.⁴ Fryxell, G.E.⁵ Graff, G.L.⁶ Song, L.⁷ Liu, J.⁸ Virden, J.W.⁹ McVay, G.L.¹⁰

9
- 0035822861
- (2001) Langmuir , vol.17 , pp. 4876-4880
- Masuda, Y.¹ Seo, W.S.² Koumoto, K.³

10
- 0035815035
- (2001) Langmuir , vol.17 , pp. 1461-1469
- Saito, N.¹ Haneda, H.² Seo, W.S.³ Koumoto, K.⁴

11
- 17044453860
- (2002) Key Eng. Mater. , vol.214-215 , pp. 203-206
- Saito, N.¹ Haneda, H.² Seo, W.S.³ Koumoto, K.⁴

12
- 0037128628
- (2002) Adv. Mater. , vol.14 , pp. 418-421
- Saito, N.¹ Haneda, H.² Sekiguchi, T.³ Ohashi, N.⁴ Sakaguchi, I.⁵ Koumoto, K.⁶

13
- 0026883870
- (1992) J. Electrochem. Soc. , vol.139 , pp. 1677-1680
- Calvert, J.M.¹ Chen, M.S.² Dnlcey, C.S.³ Georger, J.H.⁴ Peckerar, M.C.⁵ Schnur, J.M.⁶ Schoen, P.E.⁷

14
- 0027845130
- (1993) Jpn. J. Appl. Phys. , vol.32 , pp. 5829-5839
- Dressick, W.J.¹ Calvert, J.M.²

15
- 0030837286
- (1997) J. Electrochem. Soc. , vol.144
- Izaki, M.¹ Omi, T.²

16
- 0033882082
- (2000) J. Electrochem. Soc. , vol.147 , pp. 210-213
- Izaki, M.¹ Katayama, J.²

17
- 0005972406
- (2000) Proceedings of 197th ECS Meeting
- Izaki, M.¹

18
- 85039766561
- in press
- Key Eng. Mater.
- Saito, N.¹ Haneda, H.² Koumoto, K.³

19
- 0003392447
- John Wiley & Sons, New York, USA Chap. 9
- (1974) "X-ray Diffraction Procedures," 2nd ed.
- Klug, H.P.¹ Alexander, L.E.²

20
- 0034140454
- (2000) J. Cryst. Growth , vol.209 , pp. 537-541
- Hong, S.K.¹ Ko, H.J.² Chen, Y.³ Yao, T.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.