Control of crystal orientation and piezoelectric response of lead zirconate titanate thin films near the morphotropic phase boundary

Journal of the American Ceramic Society

Volumn 85, Issue 4, 2002, Pages 1019-1021

  Kakimoto, Ken Ichi ^a,d   Kakemoto, Hirofumi ^b   Fujita, Shigetaka ^c   Masuda, Yoichiro ^c  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c HACHINOHE INSTITUTE OF TECHNOLOGY   (Japan)

^d AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRIC FIELDS; FATIGUE OF MATERIALS; FERROELECTRICITY; PIEZOELECTRICITY; POLARIZATION; PULSED LASER DEPOSITION; SUBSTRATES; SYNTHESIS (CHEMICAL); THIN FILMS;

MORPHOTROPIC PHASE BOUNDARY;

LEAD COMPOUNDS;

EID: 0036545146     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2002.tb00215.x     Document Type: Article

References (16)

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8. Interferometric measurements of electric field-induced displacements in piezoelectric thin films
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