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Volumn 39, Issue 7, 2002, Pages 479-486

Surface metrology using reflected ultrasonic signals in air

Author keywords

Air coupled; Capacitance; Metrology; Transducer

Indexed keywords

ASSEMBLY; BANDWIDTH; CAPACITANCE; TRANSDUCERS; ULTRASONIC REFLECTION;

EID: 0036539776     PISSN: 0041624X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0041-624X(01)00086-5     Document Type: Article
Times cited : (32)

References (17)
  • 5
    • 0030103392 scopus 로고    scopus 로고
    • The influence of surface height distribution on the total integrated scatter (TIS) formula
    • (1996) Nanotechnology , vol.7 , pp. 43-46
    • Rakels, J.H.1
  • 15
    • 0031700462 scopus 로고    scopus 로고
    • Ultrasonic imaging of solid surfaces using a focussed air-coupled capacitance transducer
    • (1998) Ultrasonics , vol.35 , pp. 587-594
    • Schindel, D.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.