Three Dimensional Surface Depression Profiling Using Focused Air Coupled Ultrasonic Pulses

Materials Evaluation

Volumn 59, Issue 4, 2001, Pages 543-548

  Roth, Don J ^a   Kautz, Harold E ^a   Abel, Phillip B ^a   Whalen, Mike F ^b   Hendricks, J Lynne ^b   Bodis, James R ^c  

^a NASA HEADQUARTERS   (United States)

^b Sonix Inc ^*  (United States)

^c CLEVELAND STATE UNIVERSITY   (United States)

Author keywords

Air coupling; Surface profiling; Ultrasonic imaging; Ultrasonics

Indexed keywords

ACOUSTIC WAVE VELOCITY; AIR; INCIDENT LIGHT; NASA; NONDESTRUCTIVE EXAMINATION; SURFACE TOPOGRAPHY; ULTRASONIC TESTING;

AIR COUPLING; AIR-COUPLED ULTRASONIC; DIAMOND TIP; SAMPLE SURFACE; SIMPLE++; SURFACE DEPRESSIONS; SURFACE PROFILING; THREE-DIMENSIONAL SURFACE; TIME-OF FLIGHT; ULTRASONIC PULSE;

ULTRASONIC IMAGING;

EID: 0000446628     PISSN: 00255327     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (7)

1. American Society of Mechanical Engineers, ASME B46.1-1995, Surface Texture (Surface Roughness, Waviness, and Lay), New York, ASME, 1995.
2. Blessing, G.V. and D.G. Eitzen, "Ultrasonic Sensor for Measuring Surface Roughness," SPIE, Vol. 1009, Surface Measurement and Characterization, 1989, pp. 281-289.
3. Harding, K.G., "Laser Scatter Surface Finish Measurement Techniques," Loser Institute of America Proceedings of the Optical Sensing and Measurement Symposium, Vol. 73, 1992, pp. 125-135.
4. Roth, D.J., J.D. Kiser, S.M. Swickard, S.M. Szatmary and D.P. Kerwin, "Quantitative Mapping of Pore Fraction Variations in Silicon Nitride Using an Ultrasonic Contact Scan Technique," Research in Nondestructive Evaluation, Vol. 6, 1995, pp. 125-168.
5. Roth, D.J., H.E. Kautz, P.B. Abel, M.F. Whalen, J.L. Hendricks and J.R. Bodis, "3-D Surface Depression Profiling Using High Frequency Focused Air-Coupled Ultrasonic Pulses," NASA/TM - 1999-209053, 1999a.
6. Roth, D.J., M.F. Whalen, J.L. Hendricks and J.R. Bodis, "Using High Frequency Focused Water-Coupled Ultrasound for 3-D Surface Depression Profiling," NASA/TM - 1999-209268, 1999b.
7. Stout K.J., P.J. Sullivan, W.P. Dong, E. Mainsah and N. Luo, The Development of Methods For The Characterisation of Roughness in Three Dimensions, Publication EUR 15178 EN of the Commission of the European Communities, 1993.