HTS basic RSFQ cells for an optimal bit-error rate

Superconductor Science and Technology

Volumn 15, Issue 4, 2002, Pages 483-487

  Cassel, D ^a   Dittmann, R ^a   Kuhlmann, B ^a   Siegel, M ^a   Ortlepp, Th ^b   Toepfer, H ^b   Uhlmann, F H ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; INDUCTANCE; JOSEPHSON JUNCTION DEVICES; LOGIC CIRCUITS; LOGIC DESIGN; OPTIMIZATION; QUANTUM THEORY; SUPERCONDUCTING FILMS; THERMAL NOISE; YTTRIUM BARIUM COPPER OXIDES;

OPTIMAL BIT ERROR RATE; RAPID SINGLE FLUX QUANTUM LOGIC CIRCUITS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0036538757     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/15/4/301     Document Type: Article

References (12)

1. 0.5/Si resonant interband tunneling diodes
2. Transient noise simulations of RSFQ cells
3. Measurement of the error rate of single flux quantum circuits with high temperature superconductors
4. Current transport in ramp-type Josephson junctions with engineered interface
5. The inductance of a superconducting strip transmission line
6. C superconducting dc/SFQ converter
7. A general approach for determining the switching probability in rapid single flux quantum logic circuits
8. Margins and yields for SFQ circuits in HTS materials
9. Design centering methods for yield optimization of cryoelectronic circuits