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Volumn 9, Issue 2 PART 3, 1999, Pages 3850-3853

Measurement of the error rate of single flux quantum circuits with high temperature superconductors

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; JOSEPHSON JUNCTION DEVICES; LOGIC CIRCUITS; SQUIDS; THERMAL NOISE;

EID: 0032671698     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783867     Document Type: Article
Times cited : (12)

References (15)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.