Measurement of the error rate of single flux quantum circuits with high temperature superconductors

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3850-3853

  Ruck, Bernhard ^a,b   Chong, Yonuk ^a,b   Dittmann, Regina ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; JOSEPHSON JUNCTION DEVICES; LOGIC CIRCUITS; SQUIDS; THERMAL NOISE;

BICRYSTAL JUNCTIONS; SINGLE FLUX QUANTUM CIRCUITS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0032671698     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783867     Document Type: Article

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