Minimization of noise-induced bit error rate in a high Tc superconducting dc/single flux quantum converter

Applied Physics Letters

Volumn 78, Issue 9, 2001, Pages 1279-1281

  Ortlepp, Thomas ^a   Toepfer, Hannes ^a   Uhlmann, Hermann F ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001505473     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1341228     Document Type: Article

References (14)

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