A general approach for determining the switching probability in rapid single flux quantum logic circuits

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 280-283

  Ortlepp, T ^a   Toepfer, H ^a   Uhlmann, H F ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Circuit optimization; High temperature superconductivity; Noise; Superconducting devices

Indexed keywords

BIT ERROR RATE; DIFFERENTIAL EQUATIONS; FINITE DIFFERENCE METHOD; FLIP FLOP CIRCUITS; HIGH TEMPERATURE SUPERCONDUCTORS; OPTIMIZATION; PROBABILITY DENSITY FUNCTION; SUPERCONDUCTING DEVICES; THERMAL NOISE;

CIRCUIT OPTIMIZATION; FOKKER-PLANCK EQUATION; RAPID SINGLE FLUX QUANTUM LOGIC CIRCUITS; TOGGLE FLIP FLOP CIRCUIT;

LOGIC CIRCUITS;

EID: 0035269124     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919338     Document Type: Conference Paper

References (14)

1. RSFQ logic/memory family: A new Josephson-junction technology for sub-terahertz-clock-frequency digital systems
2. Transient noise simulations of RSFQ cells
3. Stochastic simulation of SFQ logic
4. Measurement of the error rate of single flux quantum circuits with high temperature superconductors
5. Signal resolution of RSFQ comparators
6. Error rate of RSFQ circuits: Theory
7. The effect of thermal noise on the operation of DC SQUIDs at 77 K - a fundamental analytical approach
8. Monte Carlo and thermal noise analysis of ultra-high-speed high temperature superconductor digital circuits
9. Brownian motion in a field of force and the diffusion model of chemical reactions
10. Pulse jitter and timing errors in RSFQ circuits
11. Development of a multilayer technology for HTS RSFQ circuits and first measurements of the error rate
12. Margins and yields of SFQ circuits in HTS materials