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Volumn 72, Issue 1-4, 2002, Pages 343-351

Solar cells prepared on multicrystalline silicon subjected to new gettering and passivation treatments

Author keywords

Al layer; Developed surface; Diamond like films; Gettering; Multicrystalline silicon; Plasma treatments

Indexed keywords

CRYSTALLINE MATERIALS; DEPOSITION; DIAMOND LIKE CARBON FILMS; DIFFUSION; PASSIVATION; PLASMAS; SILICON WAFERS;

EID: 0036533101     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(01)00182-9     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 10
    • 0006936144 scopus 로고    scopus 로고
    • Standard test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady state surface photovoltage
    • Section 10, Electrical Insulation and Electronics, Vol.10.05 Electronics (II), Designation: F 391-96
    • (1997) Annual Book of ASTM Standards


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.