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Volumn 47-48, Issue , 1996, Pages 165-170

Gettering of transition metals in multicrystalline silicon for photovoltaic applications

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL IMPURITIES; DEEP LEVEL TRANSIENT SPECTROSCOPY; EFFICIENCY; GETTERS; POLYSILICON; RAPID THERMAL ANNEALING; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON SOLAR CELLS; SILICON WAFERS; SINGLE CRYSTALS; TRANSITION METALS;

EID: 17544384164     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article
Times cited : (15)

References (25)
  • 4
    • 0000951719 scopus 로고    scopus 로고
    • Defects in Semiconductors 16, Eds. G. Davis, G. deLeo, and M. Stavola, (Trans Tech Zürich 1992)
    • V. Higgs, E. C. Lightowlers, C. E. Norman ,and P. Kightley, in: Defects in Semiconductors 16, Eds. G. Davis, G. deLeo, and M. Stavola, (Trans Tech Zürich 1992), Materials Science Forum vol. 83-87, p.p. 1309.
    • Materials Science Forum , vol.83-87 , pp. 1309
    • Higgs, V.1    Lightowlers, E.C.2    Norman, C.E.3    Kightley, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.