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Materials Research Bulletin

Volumn 37, Issue 5, 2002, Pages 891-900

Optical properties of nanocrystalline Ga1-xInxSb/SiO2 films

(3) Liu, Fa Min a Wang, Tian Min a Zhang, Li De b

a BEIHANG UNIVERSITY (China)

b INSTITUTE OF SOLID STATE PHYSICS (China)

Author keywords

A. Nanostructures; C. Raman spectroscopy; C. XPS; C. XRD; D. Optical properties

Indexed keywords

BINDING ENERGY; CRYSTAL GROWTH; DEPOSITION; LIGHT TRANSMISSION; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; RAMAN SPECTROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM COMPOUNDS; SILICA; TENSILE STRESS; X RAY DIFFRACTION;

NANOCRYSTALLINE FILMS; X-RAY PHOTOEMISSION SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 0036531526 PISSN: 00255408 EISSN: None Source Type: Journal
DOI: 10.1016/S0025-5408(02)00720-1 Document Type: Article

Times cited : (3)

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